成人交性视频免费看_日韩欧美亚洲综合久久影院_五十老熟妇乱子伦免费观看_国产产区一二三产区区别在线_国内精品伊人久久久久AV一坑_国产亚洲欧美日韩二三线

                



       MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.

 

Product's Feature：

■ Non-contact and non-invasive measurement

■ Portable measure head

■ Materials: Si, Ge

■ Application:

■ Material quality control

■ Incoming ingot & wafer inspection

■ Heavy metal contamination detection inprocessed wafers

 



Typical Customer: 

American,Europe and Asia and so on.